Automatic extraction of material defect size by infrared image sequence

Lihua Yuan*, Xiao Zhu, Quanbin Sun, Haibo Liu, Peter Yuen, Yonghuai Liu

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    8 Citations (SciVal)
    Original languageEnglish
    Article number8248
    Pages (from-to)1-29
    Number of pages29
    JournalApplied Sciences (Switzerland)
    Volume10
    Issue number22
    DOIs
    Publication statusPublished (VoR) - 2 Nov 2020

    Keywords

    • Blob analysis
    • Infrared image sequence
    • Long pulse thermography
    • Region of interest
    • Standard deviation

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