Automatic extraction of material defect size by infrared image sequence

Lihua Yuan; Xiao Zhu; Quanbin Sun; Haibo Liu; Peter Yuen; Yonghuai Liu

doi:10.3390/app10228248

Automatic extraction of material defect size by infrared image sequence

Lihua Yuan^*, Xiao Zhu, Quanbin Sun, Haibo Liu, Peter Yuen, Yonghuai Liu

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

8 Citations (SciVal)

Original language	English
Article number	8248
Pages (from-to)	1-29
Number of pages	29
Journal	Applied Sciences (Switzerland)
Volume	10
Issue number	22
DOIs	https://doi.org/10.3390/app10228248
Publication status	Published (VoR) - 2 Nov 2020

Funding

This research was funded by ?Nation Natural Science Foundation of China, grant number 51865038?, ?Chinese Government Scholarship for studying abroad, grant number 201708360122? and ?Graduate Innovation Fund of Jiangxi Province, grant number YC2020-S547?. The APC was funded by ?Nation Natural Science Foundation of China, grant number 51865038?. This work was supported by the National Natural Science Foundation of China (Grant No. 51865038), the Chinese Government Scholarship for studying abroad (Grant No. 201708360122) and the Graduate Innovation Fund of Jiangxi Province (Grant No. YC2020-S547). Acknowledgments: This work was supported by the National Natural Science Foundation of China (Grant No. 51865038), the Chinese Government Scholarship for studying abroad (Grant No. 201708360122) and the Graduate Innovation Fund of Jiangxi Province (Grant No. YC2020-S547). Funding: This research was funded by “Nation Natural Science Foundation of China, grant number 51865038”, “Chinese Government Scholarship for studying abroad, grant number 201708360122” and “Graduate Innovation Fund of Jiangxi Province, grant number YC2020-S547”. The APC was funded by “Nation Natural Science Foundation of China, grant number 51865038”.

Keywords

Blob analysis
Infrared image sequence
Long pulse thermography
Region of interest
Standard deviation

Access to Document

10.3390/app10228248

Cite this

@article{152fd4cc0d0f497288eedfbdf57cd224,

title = "Automatic extraction of material defect size by infrared image sequence",

keywords = "Blob analysis, Infrared image sequence, Long pulse thermography, Region of interest, Standard deviation",

author = "Lihua Yuan and Xiao Zhu and Quanbin Sun and Haibo Liu and Peter Yuen and Yonghuai Liu",

note = "Funding Information: This research was funded by ?Nation Natural Science Foundation of China, grant number 51865038?, ?Chinese Government Scholarship for studying abroad, grant number 201708360122? and ?Graduate Innovation Fund of Jiangxi Province, grant number YC2020-S547?. The APC was funded by ?Nation Natural Science Foundation of China, grant number 51865038?. This work was supported by the National Natural Science Foundation of China (Grant No. 51865038), the Chinese Government Scholarship for studying abroad (Grant No. 201708360122) and the Graduate Innovation Fund of Jiangxi Province (Grant No. YC2020-S547). Funding Information: Acknowledgments: This work was supported by the National Natural Science Foundation of China (Grant No. 51865038), the Chinese Government Scholarship for studying abroad (Grant No. 201708360122) and the Graduate Innovation Fund of Jiangxi Province (Grant No. YC2020-S547). Funding Information: Funding: This research was funded by “Nation Natural Science Foundation of China, grant number 51865038”, “Chinese Government Scholarship for studying abroad, grant number 201708360122” and “Graduate Innovation Fund of Jiangxi Province, grant number YC2020-S547”. The APC was funded by “Nation Natural Science Foundation of China, grant number 51865038”. Publisher Copyright: {\textcopyright} 2020 by the authors. Licensee MDPI, Basel, Switzerland.",

year = "2020",

month = nov,

day = "2",

doi = "10.3390/app10228248",

language = "English",

volume = "10",

pages = "1--29",

journal = "Applied Sciences (Switzerland)",

issn = "2076-3417",

publisher = "MDPI",

number = "22",

}

TY - JOUR

T1 - Automatic extraction of material defect size by infrared image sequence

AU - Yuan, Lihua

AU - Zhu, Xiao

AU - Sun, Quanbin

AU - Liu, Haibo

AU - Yuen, Peter

AU - Liu, Yonghuai

N1 - Funding Information: This research was funded by ?Nation Natural Science Foundation of China, grant number 51865038?, ?Chinese Government Scholarship for studying abroad, grant number 201708360122? and ?Graduate Innovation Fund of Jiangxi Province, grant number YC2020-S547?. The APC was funded by ?Nation Natural Science Foundation of China, grant number 51865038?. This work was supported by the National Natural Science Foundation of China (Grant No. 51865038), the Chinese Government Scholarship for studying abroad (Grant No. 201708360122) and the Graduate Innovation Fund of Jiangxi Province (Grant No. YC2020-S547). Funding Information: Acknowledgments: This work was supported by the National Natural Science Foundation of China (Grant No. 51865038), the Chinese Government Scholarship for studying abroad (Grant No. 201708360122) and the Graduate Innovation Fund of Jiangxi Province (Grant No. YC2020-S547). Funding Information: Funding: This research was funded by “Nation Natural Science Foundation of China, grant number 51865038”, “Chinese Government Scholarship for studying abroad, grant number 201708360122” and “Graduate Innovation Fund of Jiangxi Province, grant number YC2020-S547”. The APC was funded by “Nation Natural Science Foundation of China, grant number 51865038”. Publisher Copyright: © 2020 by the authors. Licensee MDPI, Basel, Switzerland.

PY - 2020/11/2

Y1 - 2020/11/2

KW - Blob analysis

KW - Infrared image sequence

KW - Long pulse thermography

KW - Region of interest

KW - Standard deviation

UR - https://www.scopus.com/pages/publications/85096402122

UR - https://www.scopus.com/inward/citedby.url?scp=85096402122&partnerID=8YFLogxK

U2 - 10.3390/app10228248

DO - 10.3390/app10228248

M3 - Article

AN - SCOPUS:85096402122

SN - 2076-3417

VL - 10

SP - 1

EP - 29

JO - Applied Sciences (Switzerland)

JF - Applied Sciences (Switzerland)

IS - 22

M1 - 8248

ER -

Automatic extraction of material defect size by infrared image sequence

Funding

Keywords

Access to Document

Other files and links

Fingerprint

Cite this