@article{d0a5912039314cbda22595180750cd68,
title = "Channel Length Scaling Pattern for Cylindrical Surrounding Double-Gate (CSDG) MOSFET",
keywords = "Channel length, CSDG MOSFET, nanotechnology, natural length, scaling pattern semiconductors, short channel effects (SCEs), VLSI",
author = "Uchechukwu, {Maduagwu Anthony} and Srivastava, {Viranjay M.}",
note = "Publisher Copyright: {\textcopyright} 2013 IEEE.",
year = "2020",
doi = "10.1109/ACCESS.2020.3006705",
language = "English",
volume = "8",
pages = "121204--121210",
journal = "IEEE Access",
issn = "2169-3536",
publisher = "IEEE",
}