Defect detection using a distributed blackboard architecture

Roger J. Tait*, Gerald Schaefer, Adrian A. Hopgood, Lars Nolle

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Title of host publicationSimulation in Wider Europe - 19th European Conference on Modelling and Simulation, ECMS 2005
    Pages283-287
    Number of pages5
    Publication statusPublished (VoR) - 2005
    Event19th European Conference on Modelling and Simulation, ECMS 2005 - Riga, Latvia
    Duration: 1 Jun 20054 Jun 2005

    Publication series

    NameSimulation in Wider Europe - 19th European Conference on Modelling and Simulation, ECMS 2005

    Conference

    Conference19th European Conference on Modelling and Simulation, ECMS 2005
    Country/TerritoryLatvia
    CityRiga
    Period1/06/054/06/05

    Keywords

    • Blackboard system
    • Defect detection
    • Image registration
    • Parallel image processing

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