Economical impact of RFID implementation in remanufacturing: a Chaos-based Interactive Artificial Bee Colony approach

Vishwa V. Kumar*, F. W. Liou, S. N. Balakrishnan, Vikas Kumar

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Citations (SciVal)
Original languageEnglish
Pages (from-to)815-830
Number of pages16
JournalJournal of Intelligent Manufacturing
Volume26
Issue number4
DOIs
Publication statusPublished (VoR) - 25 Aug 2015

Keywords

  • Artificial Bee colony
  • Particle swarm optimization
  • Remanufacturing
  • RFID

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