Economical impact of RFID implementation in remanufacturing: a Chaos-based Interactive Artificial Bee Colony approach

  • Vishwa V. Kumar*
  • , F. W. Liou
  • , S. N. Balakrishnan
  • , Vikas Kumar
  • *Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    27 Citations (SciVal)
    Original languageEnglish
    Pages (from-to)815-830
    Number of pages16
    JournalJournal of Intelligent Manufacturing
    Volume26
    Issue number4
    DOIs
    Publication statusPublished (VoR) - 25 Aug 2015

    Keywords

    • Artificial Bee colony
    • Particle swarm optimization
    • Remanufacturing
    • RFID

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