Examination of fault tolerance in MMPI

Daniel C. Doolan*, Sabin Tabirca

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Pages (from-to)265-270
    Number of pages6
    JournalInternational Journal of Computers, Communications and Control
    Volume3
    Issue numberSPL. ISS.
    Publication statusPublished (VoR) - 2008

    Keywords

    • Bluetooth
    • Fault tolerance
    • MMPI
    • Mobile parallel computing

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