Extended firm mutation testing: A cost reduction technique for mutation testing

Mayank Singh; Viranjay M. Srivastava

doi:10.1109/ICIIP.2017.8313788

Extended firm mutation testing: A cost reduction technique for mutation testing

Mayank Singh, Viranjay M. Srivastava

University of KwaZulu-Natal

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Citations (SciVal)

Original language	English
Title of host publication	2017 4th International Conference on Image Information Processing, ICIIP 2017
Editors	P. K. Gupta, Amit Kumar Singh, Vipin Tyagi, Satya Prakash Ghrera
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	604-609
Number of pages	6
ISBN (Electronic)	9781509067343
DOIs	https://doi.org/10.1109/ICIIP.2017.8313788
Publication status	Published (VoR) - 2 Jul 2017
Event	4th International Conference on Image Information Processing, ICIIP 2017 - Waknaghat, Shimla, India Duration: 21 Dec 2017 → 23 Dec 2017

Publication series

Name	2017 4th International Conference on Image Information Processing, ICIIP 2017
Volume	2018-January

Conference

Conference	4th International Conference on Image Information Processing, ICIIP 2017
Country/Territory	India
City	Waknaghat, Shimla
Period	21/12/17 → 23/12/17

Keywords

AspectJ Programs
Cost Reduction Techniques
Mutation Testing

Access to Document

10.1109/ICIIP.2017.8313788

Cite this

Singh, M., & Srivastava, V. M. (2017). Extended firm mutation testing: A cost reduction technique for mutation testing. In P. K. Gupta, A. K. Singh, V. Tyagi, & S. P. Ghrera (Eds.), 2017 4th International Conference on Image Information Processing, ICIIP 2017 (pp. 604-609). (2017 4th International Conference on Image Information Processing, ICIIP 2017; Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICIIP.2017.8313788

Singh, Mayank ; Srivastava, Viranjay M. / Extended firm mutation testing : A cost reduction technique for mutation testing. 2017 4th International Conference on Image Information Processing, ICIIP 2017. editor / P. K. Gupta ; Amit Kumar Singh ; Vipin Tyagi ; Satya Prakash Ghrera. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 604-609 (2017 4th International Conference on Image Information Processing, ICIIP 2017).

@inproceedings{202172234bd54d3fba8a7ad7cc518ec1,

title = "Extended firm mutation testing: A cost reduction technique for mutation testing",

keywords = "AspectJ Programs, Cost Reduction Techniques, Mutation Testing",

author = "Mayank Singh and Srivastava, {Viranjay M.}",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 4th International Conference on Image Information Processing, ICIIP 2017 ; Conference date: 21-12-2017 Through 23-12-2017",

year = "2017",

month = jul,

day = "2",

doi = "10.1109/ICIIP.2017.8313788",

language = "English",

series = "2017 4th International Conference on Image Information Processing, ICIIP 2017",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "604--609",

editor = "Gupta, {P. K.} and Singh, {Amit Kumar} and Vipin Tyagi and Ghrera, {Satya Prakash}",

booktitle = "2017 4th International Conference on Image Information Processing, ICIIP 2017",

}

Singh, M & Srivastava, VM 2017, Extended firm mutation testing: A cost reduction technique for mutation testing. in PK Gupta, AK Singh, V Tyagi & SP Ghrera (eds), 2017 4th International Conference on Image Information Processing, ICIIP 2017. 2017 4th International Conference on Image Information Processing, ICIIP 2017, vol. 2018-January, Institute of Electrical and Electronics Engineers Inc., pp. 604-609, 4th International Conference on Image Information Processing, ICIIP 2017, Waknaghat, Shimla, India, 21/12/17. https://doi.org/10.1109/ICIIP.2017.8313788

Extended firm mutation testing: A cost reduction technique for mutation testing. / Singh, Mayank; Srivastava, Viranjay M.
2017 4th International Conference on Image Information Processing, ICIIP 2017. ed. / P. K. Gupta; Amit Kumar Singh; Vipin Tyagi; Satya Prakash Ghrera. Institute of Electrical and Electronics Engineers Inc., 2017. p. 604-609 (2017 4th International Conference on Image Information Processing, ICIIP 2017; Vol. 2018-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Extended firm mutation testing

T2 - 4th International Conference on Image Information Processing, ICIIP 2017

AU - Singh, Mayank

AU - Srivastava, Viranjay M.

PY - 2017/7/2

Y1 - 2017/7/2

KW - AspectJ Programs

KW - Cost Reduction Techniques

KW - Mutation Testing

UR - http://www.scopus.com/inward/record.url?scp=85046945280&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85046945280&partnerID=8YFLogxK

U2 - 10.1109/ICIIP.2017.8313788

DO - 10.1109/ICIIP.2017.8313788

M3 - Conference contribution

AN - SCOPUS:85046945280

T3 - 2017 4th International Conference on Image Information Processing, ICIIP 2017

SP - 604

EP - 609

BT - 2017 4th International Conference on Image Information Processing, ICIIP 2017

A2 - Gupta, P. K.

A2 - Singh, Amit Kumar

A2 - Tyagi, Vipin

A2 - Ghrera, Satya Prakash

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 21 December 2017 through 23 December 2017

ER -

Singh M, Srivastava VM. Extended firm mutation testing: A cost reduction technique for mutation testing. In Gupta PK, Singh AK, Tyagi V, Ghrera SP, editors, 2017 4th International Conference on Image Information Processing, ICIIP 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 604-609. (2017 4th International Conference on Image Information Processing, ICIIP 2017). doi: 10.1109/ICIIP.2017.8313788

Extended firm mutation testing: A cost reduction technique for mutation testing

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this