Influence of Dielectrics and Channel Defects on the Electrical Performance of Oxide-based p-Channel TFTs for CMOS Applications

Viswanath G. Akkili; R. Thangavel; Viranjay M. Srivastava

doi:10.1109/LAEDC51812.2021.9437916

Influence of Dielectrics and Channel Defects on the Electrical Performance of Oxide-based p-Channel TFTs for CMOS Applications

Viswanath G. Akkili, R. Thangavel, Viranjay M. Srivastava

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Citations (SciVal)

Original language	English
Title of host publication	LAEDC 2021 - IEEE Latin America Electron Devices Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665415101
DOIs	https://doi.org/10.1109/LAEDC51812.2021.9437916
Publication status	Published (VoR) - 19 Apr 2021
Event	3rd IEEE Latin America Electron Devices Conference, LAEDC 2021 - Mexico, Mexico Duration: 19 Apr 2021 → 21 Apr 2021

Publication series

Name	LAEDC 2021 - IEEE Latin America Electron Devices Conference

Conference

Conference	3rd IEEE Latin America Electron Devices Conference, LAEDC 2021
Country/Territory	Mexico
City	Mexico
Period	19/04/21 → 21/04/21

Keywords

2D numerical simulation
Channel defects
Dielectrics
p-Type TFT
Sno

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10.1109/LAEDC51812.2021.9437916

Cite this

Akkili, V. G., Thangavel, R., & Srivastava, V. M. (2021). Influence of Dielectrics and Channel Defects on the Electrical Performance of Oxide-based p-Channel TFTs for CMOS Applications. In LAEDC 2021 - IEEE Latin America Electron Devices Conference Article 9437916 (LAEDC 2021 - IEEE Latin America Electron Devices Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LAEDC51812.2021.9437916

Akkili, Viswanath G. ; Thangavel, R. ; Srivastava, Viranjay M. / Influence of Dielectrics and Channel Defects on the Electrical Performance of Oxide-based p-Channel TFTs for CMOS Applications. LAEDC 2021 - IEEE Latin America Electron Devices Conference. Institute of Electrical and Electronics Engineers Inc., 2021. (LAEDC 2021 - IEEE Latin America Electron Devices Conference).

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year = "2021",

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Akkili, VG, Thangavel, R & Srivastava, VM 2021, Influence of Dielectrics and Channel Defects on the Electrical Performance of Oxide-based p-Channel TFTs for CMOS Applications. in LAEDC 2021 - IEEE Latin America Electron Devices Conference., 9437916, LAEDC 2021 - IEEE Latin America Electron Devices Conference, Institute of Electrical and Electronics Engineers Inc., 3rd IEEE Latin America Electron Devices Conference, LAEDC 2021, Mexico, Mexico, 19/04/21. https://doi.org/10.1109/LAEDC51812.2021.9437916

Influence of Dielectrics and Channel Defects on the Electrical Performance of Oxide-based p-Channel TFTs for CMOS Applications. / Akkili, Viswanath G.; Thangavel, R.; Srivastava, Viranjay M.
LAEDC 2021 - IEEE Latin America Electron Devices Conference. Institute of Electrical and Electronics Engineers Inc., 2021. 9437916 (LAEDC 2021 - IEEE Latin America Electron Devices Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Influence of Dielectrics and Channel Defects on the Electrical Performance of Oxide-based p-Channel TFTs for CMOS Applications

AU - Akkili, Viswanath G.

AU - Thangavel, R.

AU - Srivastava, Viranjay M.

PY - 2021/4/19

Y1 - 2021/4/19

KW - 2D numerical simulation

KW - Channel defects

KW - Dielectrics

KW - p-Type TFT

KW - Sno

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U2 - 10.1109/LAEDC51812.2021.9437916

DO - 10.1109/LAEDC51812.2021.9437916

M3 - Conference contribution

AN - SCOPUS:85108225486

T3 - LAEDC 2021 - IEEE Latin America Electron Devices Conference

BT - LAEDC 2021 - IEEE Latin America Electron Devices Conference

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 3rd IEEE Latin America Electron Devices Conference, LAEDC 2021

Y2 - 19 April 2021 through 21 April 2021

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Akkili VG, Thangavel R, Srivastava VM. Influence of Dielectrics and Channel Defects on the Electrical Performance of Oxide-based p-Channel TFTs for CMOS Applications. In LAEDC 2021 - IEEE Latin America Electron Devices Conference. Institute of Electrical and Electronics Engineers Inc. 2021. 9437916. (LAEDC 2021 - IEEE Latin America Electron Devices Conference). doi: 10.1109/LAEDC51812.2021.9437916

Influence of Dielectrics and Channel Defects on the Electrical Performance of Oxide-based p-Channel TFTs for CMOS Applications

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Keywords

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