Modeling of bending behavior of IPMC beams using concentrated ion boundary layer

W.A. Lughmani, J.Y. Jho, J.Y. Lee, K. Rhee

Research output: Contribution to journal › Article › peer-review

21 Citations (SciVal)

Original language	English
Journal	International Journal of Precision Engineering and Manufacturing
DOIs	https://doi.org/10.1007/s12541-009-0104-2
Publication status	Published (VoR) - 20 Jan 2010

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title = "Modeling of bending behavior of IPMC beams using concentrated ion boundary layer",

author = "W.A. Lughmani and J.Y. Jho and J.Y. Lee and K. Rhee",

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T1 - Modeling of bending behavior of IPMC beams using concentrated ion boundary layer

AU - Lughmani, W.A.

AU - Jho, J.Y.

AU - Lee, J.Y.

AU - Rhee, K.

PY - 2010/1/20

Y1 - 2010/1/20

UR - https://www.scopus.com/pages/publications/77149176287

U2 - 10.1007/s12541-009-0104-2

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SN - 1229-8557

JO - International Journal of Precision Engineering and Manufacturing

JF - International Journal of Precision Engineering and Manufacturing

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