Regression Analysis of Static Noise Margin and Transconductance for Underlap Lengths of FinFET

Rituraj S. Rathore; Viranjay M. Srivastava

doi:10.1109/ISSE54558.2022.9812809

Regression Analysis of Static Noise Margin and Transconductance for Underlap Lengths of FinFET

Rituraj S. Rathore, Viranjay M. Srivastava

University of KwaZulu-Natal

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (SciVal)

Original language	English
Title of host publication	2022 45th International Spring Seminar on Electronics Technology, ISSE 2022
Publisher	IEEE Computer Society
ISBN (Electronic)	9781665465892
DOIs	https://doi.org/10.1109/ISSE54558.2022.9812809
Publication status	Published (VoR) - 2022
Event	45th International Spring Seminar on Electronics Technology, ISSE 2022 - Vienna, Austria Duration: 11 May 2022 → 15 May 2022

Publication series

Name	Proceedings of the International Spring Seminar on Electronics Technology
Volume	2022-May
ISSN (Print)	2161-2528
ISSN (Electronic)	2161-2536

Conference

Conference	45th International Spring Seminar on Electronics Technology, ISSE 2022
Country/Territory	Austria
City	Vienna
Period	11/05/22 → 15/05/22

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10.1109/ISSE54558.2022.9812809

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Rathore, R. S., & Srivastava, V. M. (2022). Regression Analysis of Static Noise Margin and Transconductance for Underlap Lengths of FinFET. In 2022 45th International Spring Seminar on Electronics Technology, ISSE 2022 (Proceedings of the International Spring Seminar on Electronics Technology; Vol. 2022-May). IEEE Computer Society. https://doi.org/10.1109/ISSE54558.2022.9812809

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title = "Regression Analysis of Static Noise Margin and Transconductance for Underlap Lengths of FinFET",

author = "Rathore, {Rituraj S.} and Srivastava, {Viranjay M.}",

note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 45th International Spring Seminar on Electronics Technology, ISSE 2022 ; Conference date: 11-05-2022 Through 15-05-2022",

year = "2022",

doi = "10.1109/ISSE54558.2022.9812809",

language = "English",

series = "Proceedings of the International Spring Seminar on Electronics Technology",

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booktitle = "2022 45th International Spring Seminar on Electronics Technology, ISSE 2022",

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Rathore, RS & Srivastava, VM 2022, Regression Analysis of Static Noise Margin and Transconductance for Underlap Lengths of FinFET. in 2022 45th International Spring Seminar on Electronics Technology, ISSE 2022. Proceedings of the International Spring Seminar on Electronics Technology, vol. 2022-May, IEEE Computer Society, 45th International Spring Seminar on Electronics Technology, ISSE 2022, Vienna, Austria, 11/05/22. https://doi.org/10.1109/ISSE54558.2022.9812809

Regression Analysis of Static Noise Margin and Transconductance for Underlap Lengths of FinFET. / Rathore, Rituraj S.; Srivastava, Viranjay M.
2022 45th International Spring Seminar on Electronics Technology, ISSE 2022. IEEE Computer Society, 2022. (Proceedings of the International Spring Seminar on Electronics Technology; Vol. 2022-May).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Srivastava, Viranjay M.

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Y2 - 11 May 2022 through 15 May 2022

ER -

Regression Analysis of Static Noise Margin and Transconductance for Underlap Lengths of FinFET

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