Fingerprint
Dive into the research topics of 'Regression Analysis of Static Noise Margin and Transconductance for Underlap Lengths of FinFET'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Rituraj S. Rathore, Viranjay M. Srivastava
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review