Scanning the technology applications of asynchronous circuits

C. H. Van Kees Berkel; Mark B. Josephs; Steven M. Nowick

doi:10.1109/5.740016

Scanning the technology applications of asynchronous circuits

C. H. Van Kees Berkel^*, Mark B. Josephs, Steven M. Nowick

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

154 Citations (SciVal)

Original language	English
Pages (from-to)	223-233
Number of pages	11
Journal	Proceedings of the IEEE
Volume	87
Issue number	2
DOIs	https://doi.org/10.1109/5.740016
Publication status	Published (VoR) - 1999

Keywords

Asynchronous circuits
Asynchronous systems
CAD tools
Heterogeneous timing
High performance
Low noise
Low power
Testability

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10.1109/5.740016

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title = "Scanning the technology applications of asynchronous circuits",

keywords = "Asynchronous circuits, Asynchronous systems, CAD tools, Heterogeneous timing, High performance, Low noise, Low power, Testability",

author = "{Van Kees Berkel}, {C. H.} and Josephs, {Mark B.} and Nowick, {Steven M.}",

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journal = "Proceedings of the IEEE",

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AU - Josephs, Mark B.

AU - Nowick, Steven M.

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KW - CAD tools

KW - Heterogeneous timing

KW - High performance

KW - Low noise

KW - Low power

KW - Testability

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Scanning the technology applications of asynchronous circuits

Keywords

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