Scanning the technology applications of asynchronous circuits

C. H. Van Kees Berkel*, Mark B. Josephs, Steven M. Nowick

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    153 Citations (SciVal)
    Original languageEnglish
    Pages (from-to)223-233
    Number of pages11
    JournalProceedings of the IEEE
    Issue number2
    Publication statusPublished (VoR) - 1999


    • Asynchronous circuits
    • Asynchronous systems
    • CAD tools
    • Heterogeneous timing
    • High performance
    • Low noise
    • Low power
    • Testability


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